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High Performance X-Ray Fluorescence Measuring Instrument for fast and non-destructive Material Analysis and Coating Thickness Measurement
Neo ALFA Si-pin
analysis, user-friendly interface Easy to analyze composition and karat results with one push of a button accurate chemistry and karat results within seconds Designed to be compact, taking up minimum desktop space. An attractive design suitable for the showroom floor. Quick certificate results with PC software. Interior lighting and camera allows continuous sample viewing for utmost customer security Easy access to the test results by uploading and downloading to the network

General Specification
  • Intended use Energy dispersive X-ray measuring instrument EDXRF) to analyze precious metals and their alloys in composition and coating thickness.
  • Element range Chlorine to Uranium U Potassium
  • Repeatability <0,l0
  • Design Bench top unit with upwards opening hood
  • Measurement direction From bottom to top
  • Temperature: 15-30°C Humidity: 30%~70% Power supply: AC 220V ±10%
Features and advantages
  • Specifications Composition range: 1ppm to 100 %
  • Repeatability: RSD<0.10% Au>99%
  • Sample type : Solid, powders, liquid
  • liquid Elements of interests: Au, Ag, Pt, Pd, Ru, Rh, W, Os, Ir, etc.
  • Basic metals: Cr, Mn, Fe, Co, Ni, Cu, Zn, Cd, Sn, Pb, etc.
  • Tube voltage: 5KV ~ 50KV
  • HV unit 0 ~ 50KV
  • Tube current: 0µA ~ 1000µA
  • chamber Dimensions 310*260*60 (mm) Test time 30sec ~ 100Sec
  • instrument dimensions : 380*372*362 (mm) I nstrument weight 36Kg
Working Enviroment
X-Ray Detection
  • X-ray detector Silicon Pin Detector S(i-pin)
  • Resolution fwhm for Mn-Ka) <250 eV
  • Measuring distance Fix
Sample Alignment
  • Sample positioning Manually
  • High-resolution CCD color camera for optical monitoring of the measurement,
  • Crosshairs with a calibrated scale (ruler) and spot-indicator,
Electrical Data
  • Power supply AC 230 V 50 / 60 Hz
  • Power consumption max. 120 W, without evaluation PC
  • Protection class IP40