High Performance X-Ray Fluorescence Measuring Instrument for fast and non-destructive Material Analysis and Coating Thickness Measurement

Neo ALFA FSDD (MCR) / ALFA SDD / ALFA SI-Pin analysis, user-friendly interface Easy to analyze composition and karat results with one push of a button accurate chemistry and karat results within seconds Designed to be compact, taking up minimum desktop space.with Direct Shooting X-Ray, An attractive Design suitable for the showroom floor.Hallmarking Centre And Tunch Lab. lighting and camera allows continuous sample viewing for Best customer security Easy access to the test results Neo Instrument Co. Fast certificate results with PC software. Interior

The two most distinctive features of the EXE Series are precision video imaging, and “bottom-up” measurement using a motorized Z-axis with laser-based auto-focus.

An available manual XY stage with 1.5X1.5” travel facilitates easy positioning of small and large parts.

The standard configuration includes a single fixed collimator, solid-state PIN detector Silicon Drift Detector and long-life micro-focus x-ray tube/Silicon Drift Detector