X-RAY
High Performance X-Ray Fluorescence
Measuring Instrument for fast and non-destructive Material Analysis and
Coating Thickness Measurement
Neo ALFA FSDD (MCR) / ALFA SDD / ALFA SI-Pin analysis, user-friendly
interface Easy to analyze composition and karat results with one push of a
button accurate chemistry and karat results within seconds Designed to be
compact, taking up minimum desktop space.with Direct Shooting X-Ray, An
attractive Design suitable for the showroom floor.Hallmarking Centre And
Tunch Lab. lighting and camera allows continuous sample viewing for Best
customer security Easy access to the test results Neo Instrument Co. Fast
certificate results with PC software. Interior
Key Features
The two most distinctive features of the EXE
Series are precision video imaging, and bottom-up measurement
using a motorized Z-axis with laser-based auto-focus.
An available manual XY stage with 1.5X1.5 travel facilitates easy
positioning of small and large parts.
Configuration
The standard configuration includes a single
fixed collimator, solid-state PIN detector Silicon Drift Detector and
long-life micro-focus x-ray tube/Silicon Drift Detector